γ-Radiation “Aging” of Thin Film TiO2

Authors

  • Kevin Clark Slezak University of Wisconsin La Crosse

DOI:

https://doi.org/10.17307/wsc.v1i1.171

Keywords:

Thin Films, Gamma Radiation

Abstract

Titanium dioxide (TiO2), a wide-bandgap semiconductor, has in recent decades been the subject of intense scientific study due to its photoactive properties.  Although TiO2 has been thoroughly researched in projects regarding applications of those properties, few, if any, have focused on how the electrical and structural properties change over long term exposure to damaging high energy radiation.  This type of radiation can alter the atomic structure of the material which leads to changes in characteristic properties.  Our present study seeks to understand the long and short term effects that exposure to high energy radiation has on TiO2.    

We exposed thin films of TiO2 to a 137Cs (661.8 keV) γ-radiation source for varying amounts of time.  After irradiation, the structural, optical, and electrical properties were fully characterized to examine the impact of radiation exposure on this technologically important material.  

Author Biography

Kevin Clark Slezak, University of Wisconsin La Crosse

Kevin Slezak is senior student majoring in Physics and Materials Engineering.  He will conclude his undergradruate degree at the University of Wisconsin Milwaukee.

References

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Wei C., & Chang, C. “Polycrystalline TiO2 Thin Films with Different Thicknesses Deposited on Unheated Substrates Using RF Magnetron Sputtering.†Materials Transactions 52.3 (2011): 554-559.

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Published

2017-01-13

How to Cite

Slezak, K. C. (2017). γ-Radiation “Aging” of Thin Film TiO2. Proceedings of the Wisconsin Space Conference, 1(1). https://doi.org/10.17307/wsc.v1i1.171

Issue

Section

Physics and Engineering